众彩官网-(中国)股份有限公司




  1. Silicon wafer AOI equipment

    Product Introduction

    Bright-field and dark-field wafer surface inspection using high-resolution imaging  based on three modes: image algorithm, detection model and anomaly detection, and provides statistical analysis.

    2D Inspection accuracy
    um

    1

    UPH
    pcs/h

    60

    Escape
    ppm

    ≤50

    众彩官网-(中国)股份有限公司

    众彩官网-(中国)股份有限公司